Keithley 2502 Dual-Channel Picoammeter

The Keithley 2502 Dual-Channel Picoammeter is engineered for precision and efficiency, offering two independent picoammeter-voltage source channels ideal for a variety of low-level measurement applications, including laser diode testing. This cutting-edge instrument enhances throughput for Keithley's LIV (light-current-voltage) test system, specifically designed for the production testing of laser diode modules (LDMs). Developed in collaboration with top manufacturers in the fiber optic telecommunications sector, the Keithley 2502 facilitates seamless synchronization with other system elements, enabling precise optical power measurements.

Key Features and Specifications

• Fiber Alignment Photodiode Meter with Voltage Source
• Dual-Channel Capabilities:
  • Optical power measurements
  • Scanning electron microscope (SEM) beam measurements
  • Nanoscale materials assessment
  • Device research applications
• Production Testing Applications:
  • Laser diode modules
  • Chip on submount laser diodes
  • LEDs
  • Passive optical components
  • Laser diode bars
  • Fiber alignment processes
• ±100V source to meet diverse biasing requirements
• Measurement range for photodetector current: 1fA to 20mA
• Exceptional current measurement resolution of 1fA
• Direct optical power measurement capability when paired with the Model 2500INT Integrating Sphere
• Includes an analog output jack for each channel on the rear panel
• Delivers 0–10V analog output for high-resolution optical power feedback
• Provides a high accuracy, high-speed solution for fiber alignment
• Supports assembly processes, final testing, parts binning, and specifications
• Facilitates rapid alignment of fiber with the laser diode’s optimal light-emitting region
• Integrates fiber alignment and device characterization processes
• User-programmable photodetector calibration coefficients for tailored precision
• 3,000-point buffer memory on each channel for data logging after test completion
• Digital I/O and Trigger Link functionality to support binning and sweep test operations
• Standard connectivity options including IEEE-488 and RS-232 interfaces