RENT KEITHLEY 2520 Pulsed Laser Diode Test System (Call for Availability)
The Keithley 2520 Pulsed Laser Diode Test System is an advanced integrated solution designed for the precise testing of laser diodes, particularly during the early stages of manufacturing where managing temperature control can be challenging. This compact, half-rack instrument combines all necessary sourcing and measurement functionalities for both pulsed and continuous LIV (light-current-voltage) testing, streamlining your testing process into a single device.
A key feature of the Keithley 2520 is its impressive synchronization capabilities, allowing for high measurement accuracy even under rapid testing conditions with pulse widths as brief as 500ns. It houses three dedicated channels of source and measurement circuitry, all governed by a single digital signal processor (DSP). This design guarantees exceptionally tight synchronization between sourcing and measurement tasks, improving data accuracy and reliability.
The laser diode drive channel is equipped with a robust current source alongside integrated voltage measurement capabilities. Additionally, the two photodetector channels each offer adjustable voltage bias and voltage compliance, complemented by current measurement features. This comprehensive channel setup equips users with everything necessary for complete LIV characterization of laser diodes, facilitating testing before they are integrated into temperature-controlled modules.
By combining sourcing and measurement functionalities in one cohesive device, the Keithley 2520 significantly enhances testing throughput and efficiency, eliminating the outdated need for GPIB commands associated with multiple standalone instruments.
For extensive specifications and technical details, please refer to the datasheet.
