Keithley 2651A SourceMeter

The Keithley 2651A SourceMeter is an advanced instrument meticulously engineered to facilitate the characterization and testing of high-power electronics. Ideal for use in research and development, reliability testing, and production environments, it excels in applications involving high brightness LEDs, power semiconductors, DC-DC converters, batteries, and an array of high-power materials, components, modules, and subassemblies.

Key Features:

• The device offers a highly flexible, four-quadrant voltage and current source/load paired with precision voltage and current meters, providing a multitude of functionalities including:
• Semiconductor characterization instrument
• Voltage or current waveform/pulse generator
• Precision power supply, true current source
• Digital multimeter (DCV, DCI, ohms, power) with 5½-digit resolution
• Precision electronic load

Specifications:

• Power Output:
  • 2000W pulsed power (±40V, ±50A)
  • 200W DC power (±10V@±20A, ±20V@±10A, ±40V@±5A)
  • Capability of up to 50A @ 40V with pA and µV resolution
• Easily connect two units in series or parallel, achieving solutions up to ±100A or ±80V.
• Precision measurement capability with 1pA resolution for accurate low leakage current assessments.
• 1µs per point (1MHz) continuous 18-bit sampling to precisely characterize transient behaviors.
• Flexible 1% to 100% pulse duty cycle caters to pulse-width modulated (PWM) drive schemes and specific device drive stimuli.
• Combines multiple functionalities into a singular instrument, including:
  • Precision power supply
  • Current source
  • Digital multimeter
  • Arbitrary waveform generator
  • Voltage or current pulse generator
  • Measurement tools
  • Electronic load
  • Trigger controller
• Usable as a bench-top I-V characterization tool or as part of a multi-channel I-V test system.
• TSP Express software simplifies common I-V tests without requiring programming or installation.
• Compatible with LabVIEW® driver for enhanced functionality.
• Optional ACS Basic Edition software for semiconductor component characterization, now with Trace mode to generate characteristic curves.
• Keithley's Test Script Processor (TSP®) allows for the development of custom user test scripts and supports programming sequences for asynchronous instrument operation without direct PC control.
• Parallel testing capabilities with precise timing when connecting multiple Series 2600A instruments.
• LXI class C compliance ensures network connectivity.
• 14 digital I/O lines provide direct interaction with probe stations and automation tools.
• USB port facilitates additional data and test program storage via USB memory devices.

Applications:

• Characterization and testing of power semiconductors, HBLEDs, and optical devices.
• Characterization of GaN, SiC, and other compound materials and devices.
• Semiconductor junction temperature characterization.
• High-speed, high-precision digitization.
• Electromigration studies.
• Testing of high current, high power devices.