KEITHLEY 4200-SCS Semiconductor Characterization System
The Keithley 4200-SCS is a top-of-the-line Semiconductor Characterization System designed for advanced device testing in laboratory settings. This system excels in both DC and pulse device characterization, delivering exceptional precision with sub-femtoamp resolution. Equipped with a fully integrated embedded PC running a Windows operating system, the 4200-SCS provides users with comprehensive mass storage capabilities alongside powerful data analysis tools for efficient research outcomes.
Key Features:
- Intuitive Interface: Navigate easily with a point-and-click Windows®-based environment that simplifies test execution.
- Remote PreAmps: Unique Remote PreAmps extend the resolution of Source Measurement Units (SMUs) to an impressive 0.1 fA.
- C-V Measurement: The built-in C-V instrument allows for user-friendly capacitance-voltage measurements akin to DC I-V testing.
- Advanced Pulse Testing: The system supports pulse and pulse I-V capabilities, essential for sophisticated semiconductor evaluations.
- Integrated Scope Functionality: A dedicated scope card incorporates integrated scope and pulse measurement functions for comprehensive analysis.
- Self-Contained PC: Enjoy fast test setups and robust data management with powerful built-in graphing, printing, and on-board mass storage for effortless test result organization.
- Project Navigator: The unique browser-style Project Navigator organizes tests by device type, enabling access to multiple tests, sequencing, and looping control with ease.
- Reliability Testing: Built-in stress/measure capabilities provide point-and-click reliability testing, including five JEDEC compliant sample tests for industry-standard evaluations.
- Comprehensive Instrument Support: Integrated support is available for a variety of LCR meters, Keithley switch matrix configurations, and pulse generators from both Keithley Series 3400 and Agilent 81110 series.
- Software Drivers: Included software drivers facilitate seamless integration with leading analytical probers, enhancing testing flexibility.
Whether you are conducting semiconductor device characterization or reliability testing, the Keithley 4200-SCS stands as an indispensable tool, combining cutting-edge technology and user-friendly features for unparalleled performance in laboratory environments.
