KEITHLEY 4200A-SCS
The Keithley 4200A-SCS Semiconductor Parameter Analyzer Characterization System is engineered for sophisticated lab-grade DC and pulse device characterization. Offering high precision measurements with sub-femtoamp resolution, it excels in real-time plotting and analysis, empowering users with accurate data for in-depth evaluation.
This advanced system is designed to streamline characterization processes, reducing setup complexity by up to 50%. With embedded measurement expertise—an industry first—the 4200A-SCS provides test guidance that instills confidence in results without compromise.
Key Features of the Keithley 4200A-SCS:
- Multi-lingual built-in measurement videos in English, Chinese, Japanese, and Korean for enhanced user support.
- Over 450 user-modifiable application tests to accelerate your testing process.
- Automated real-time parameter extraction for seamless data management, including graphing and arithmetic functions.
- The innovative 4200A-CVIV Multi-Switch automatically toggles between I-V and C-V measurements, eliminating the need for time-consuming re-cabling or adjustments. The four-channel display enhances visibility for quick test setup and troubleshooting during unexpected results.
- Easily reposition C-V measurements across device terminals without redundant cabling.
- User-configurable settings for low current applications.
- Customizable output channel names for improved organization.
- Real-time test status visibility for efficient monitoring.
Features of the Keithley 4200A-SCS System:
- Intuitive touch-screen interface powered by Clarius SW on an embedded Windows 7 computer.
- Optional Remote Pre-Amplifiers extend SMU resolution to an exceptional 10 aA.
- C-V functionality simplifies such measurements to resemble standard DC I-V testing.
- Pulse and pulsed I-V capabilities to meet advanced semiconductor testing demands.
- Integrated scope card for comprehensive scope and pulse measurement functionality.
- Self-contained PC for efficient test setups, powerful data analysis, and on-board mass storage of test records.
- Furnished with expert measurement support and hundreds of ready-to-utilize application tests.
- Built-in stress/measure functionality, integrating looping and data analysis for reliable testing, including five JEDEC compliant sample tests.
- Compatible with a range of LCR meters, Keithley switch matrix setups, and Keithley Series 3400 and Agilent 81110 pulse generators.
- Comprehensive software drivers available for leading analytical probers.
Specifications of the 4200A-SCS:
- Current-Voltage (I-V) Range:
- Capacitance-Voltage (C-V) Range: 1 kHz – 10 MHz ± 30V DC bias
- Pulsed I-V Range: ±40 V (80 V p-p), ±800 mA at 200 MSa/sec, with a 5 ns sampling rate.
