RENT KEITHLEY 590 CV ANALYZER (call for availability)
The Keithley Model 590 CV Analyzer is a cutting-edge instrument designed specifically for measuring capacitance versus voltage (C-V) and capacitance versus time (C-t) characteristics of semiconductor devices. Engineered to meet the rigorous demands of semiconductor testing, the Model 590 stands apart from conventional capacitance measurement tools, delivering precision and reliability tailored for advanced applications.
This analyzer operates at high frequencies of either 100 kHz or 1 MHz, making it ideal for testing p-n junctions, Schottky junctions, and Metal-Insulator-Semiconductor (MIS) devices. The resulting CV measurements are intrinsically linked to the performance metrics of a variety of functional devices including Field-Effect Transistors (FETs), memory cells, Charge-Coupled Devices (CCDs), and various isolation structures.
Key Features and Specifications:
- Capacitance measurement range up to 20 nF at 100 kHz, using the Model 5904 adapter, perfect for evaluating large, leaky, or forward-biased devices.
- Exceptional sensitivity of 0.1 fF is available for testing smaller devices, ensuring precision across the board.
- Test signal voltage is precisely set at 15 mV rms for consistent performance in measurements.
- Flexibility with test frequencies: Select between 1 MHz to align with existing test standards or utilize 100 kHz for enhanced resolution, range, and accuracy.
- Configurable measurement rates from 1 to 1000 readings per second alongside selectable filters that optimize speed and resolution depending on testing requirements.
- Advanced error correction capabilities are in place to address transmission line errors caused by device connections, delivering accurate results.
- Integrated storage for test setups and correction values assists in data analysis and plotter control, significantly reducing the need for extensive computer programming.
- Support for measurement frequencies of 100 kHz, 1 MHz, or a combination of both to suit various testing scenarios.
- Comprehensive measurement capacities for capacitance ranging from 10 fF to 20 nF, alongside conductance measurements between 0.1 nS and 1 µS.
- Internal error correction functions are included to mitigate errors introduced by cables, connections, and switching paths.
- The system boasts robust built-in capabilities for test setup, data storage, and analysis, promoting efficiency in laboratory environments.
