Keysight / Agilent 4155B Semiconductor Parameter Analyzer
The Keysight / Agilent 4155B Semiconductor Parameter Analyzer is an advanced solution for comprehensive semiconductor testing. This exceptional device is equipped with four built-in source/monitor units (SMUs), two voltage source units (VSUs), and two voltage monitor units (VMUs), making it ideal for a variety of basic semiconductor applications. With non-Kelvin connections and an impressive 10 V resolution, the 4155B ensures reliable and precise measurements across a measurement range of 100 mA/100 Ohm.
Key Features:
- Exceptional resolution and accuracy: Current range from 1 fA to 1 A with 20 fA offset accuracy, and voltage range from 1 µV to 200 V.
- Fully automated I-V sweep measurements available in dc or pulse mode for increased efficiency.
- Capability to expand up to 6 SMUs, allowing for versatile configurations to suit various testing needs.
- Synchronized stress/measure function enhances the precision of your analytics during testing.
- Two high-voltage pulse generator units (±40 V) enable detailed stress testing of semiconductor components.
- Advanced time-domain measurement capabilities with intervals from 60 µs up to 10,001 points, providing detailed data collection.
- User-friendly operation with a knob-sweep feature that mimics a curve tracer for intuitive control.
- In-built automatic analysis functions simplify data interpretation and reduce user workload.
- Automation support via built-in HP Instrument BASIC and trigger I/O capabilities for seamless integration into your workflows.
