Keysight / Agilent 4156B Precision Semiconductor Parameter Analyzer
The Keysight / Agilent 4156B Precision Semiconductor Parameter Analyzer redefines device characterization with its unparalleled accuracy and advanced features. Designed for engineers and researchers, this powerful instrument features superior low-current and low-voltage resolution, ensuring reliable measurements for a wide range of semiconductor devices. Its built-in quasi-static capacitance-voltage (CV) measurement capability sets the groundwork for future expansions with additional measurement instruments.
Key Features and Specifications:
- High-Resolution Source/Monitor Unit (HRSMU): Capable of measuring from 1fA/2mV to 100mA/100V, providing exceptional resolution for critical parameter analysis.
- Flexible Measurement Control: Set both measurement and stress conditions to customize how devices are tested and characterized.
- Automated Execution: Control the execution of measurements and stress applications seamlessly for enhanced workflow efficiency.
- Advanced Calculations: Perform arithmetic calculations to derive critical metrics from measurement data directly on the device.
- LCD Display: View real-time measured and calculated results on a high-quality LCD display for immediate feedback and analysis.
- Graphical Analysis: Conduct in-depth graphical analysis to visualize data trends and characteristics effectively.
- Hardcopy Output: Easily dump results to printers or plotters for tangible documentation of your findings.
- Self-Test and Auto Calibration: Ensure consistent performance with built-in self-tests and automatic calibration routines.
- Integrated HP Instrument B: Perform measurements and analysis tasks efficiently with the internal HP Instrument B module.
- Comprehensive Source/Monitor Units: Equipped with four high-resolution source/monitor units alongside two voltage source units and two voltage monitor units ASIC for robust device testing.
- Data Management: Store and recall your measurement setups, as well as graphical display data, to optimize research efficiency.
