RENT AGILENT / HP 8131A Pulse Generator (call for availability)
The Agilent / HP 8131A Pulse Generator is an advanced instrument that boasts an impressive 500 MHz repetition rate and customizable transition times, making it an indispensable tool for various applications. Designed for parametric and functional testing, this generator excels in measuring devices at high speeds, ensuring accurate results even in demanding environments. With its ability to automate measurements through a programmable input trigger level, the 8131A enhances the efficiency and reliability of your testing processes.
This fully programmable pulse generator offers unparalleled performance flexibility, making it ideal for R&D, production engineering, incoming component inspection, and high-speed functional tests. Leveraging a standardized programming language (HP-SL), users can easily program, upload, and download settings to meet evolving testing requirements.
The Agilent 8131A Pulse Generator features variable edge cleaning down to less than 1 ns, accommodating a wide range of technologies such as BICMOS, ECL, and ECLips. It also opens the door to analog applications, facilitating rapid bandwidth assessments and amplifier slew rate measurements. For cell characterization that requires simultaneous clock and data signals, the Agilent / HP 8131A with Option 020 provides a second synchronized channel, simulating a clock while producing a series of binary signals in non-return-to-zero (NRZ) format at data rates up to 280 Mbit/s.
With a timing resolution significantly surpassing typical gate delays, this pulse generator eliminates time-window uncertainties, resulting in more precise measurements. Transition times of less than 200 ps from 10% to 90% amplitude (typical 150 ps from 20% to 80% amplitude) ensure repeatable and reliable timing measurements, particularly vital for high-speed digital circuits.
Key Features and Specifications of the Agilent / HP 8131A Pulse Generator:
- Variable transitions for precise adjustments
- Rapid Automatic Test Equipment (ATE) integration capabilities
- Burst and Gate Triggering Modes for flexible signal generation
- Compatible with BICMOS, ECL, and GaAs technology
- Transition times below 200 ps for accurate timing measurements
- Renders repetitive testing with rates up to 500 MHz (up to 1 GHz in transducer mode)
- Sharp, clean edges that reduce errors from threshold uncertainties
- Fully programmable through HP-IB for seamless operation
