Keysight B1510A: Precision Measurement at its Best
The Keysight B1510A (Agilent) Source/Measure Unit (SMU) represents cutting-edge technology in the realm of semiconductor device characterization. As an integral part of the Agilent / Keysight B1500A Semiconductor Device Parameter Analyzer, the B1510A combines voltage and current sourcing with sophisticated measurement capabilities, allowing you to achieve precise DC current-voltage (IV) measurements with an incredible resolution of up to fA and µV.
For applications requiring enhanced measurement performance, the B1510A can be expanded with the optional Atto Sense Switch Unit (ASU), which allows for measurements down to the sub-fA level. This feature makes it ideal for researchers and engineers working with sensitive materials and components.
In addition to its IV measurement capabilities, the B1510A excels in Quasi-Static Capacitance-Voltage (QS-CV) measurements. This essential technique helps characterize low-frequency CV characteristics, providing critical insights into the surface states of transistors. With built-in leak current compensation, accurate QS-CV measurements are at your fingertips.
Furthermore, the compatibility with EasyEXPERT software enhances your analysis and data management capabilities, making the B1510A a vital tool for characterizing not only semiconductor devices but also advanced materials such as carbon nanotubes (CNT) and carbon nanowires (CNW), as well as various active and passive components.
Key Features and Specifications:
- MPSMU Range: Up to 100 V / 100 mA with full 4-quadrant operation
- Minimum Measurement Resolution: 10 fA / 0.5 µV
- Minimum Source Resolution: 50 fA / 25 µV
- Maximum Pulse Width: 2 seconds
- Optional ASU Support: Expands range down to 1 pA with 0.1 fA measurement resolution
