Keysight B1512A HCSMU (High Current SourceMeter)
The Keysight B1512A High Current SourceMeter (HCSMU) is an advanced Source/Measure Unit (SMU) designed to provide exceptional measurement and sourcing capabilities for a wide range of applications in semiconductor testing, materials characterization, and electrical measurements. This versatile instrument is integral to the Agilent/Keysight B1505 Power Device Analyzer and Curve Tracer system, facilitating precise DC current-voltage (IV) measurement.
Key Features:
- High Current Capacity: With a maximum output current of up to 3 A, the B1512A is ideal for testing high-power devices and applications that require robust current sourcing.
- Versatile Measurement Functions: The B1512A supports comprehensive measurements, including voltage, current, resistance, and power, allowing for in-depth analysis of device characteristics.
- Advanced Control and Automation: Equipped with intuitive software and programming capabilities, users can automate testing procedures to enhance productivity and throughput.
- Accuracy and Precision: The instrument delivers high measurement resolution with excellent accuracy, ensuring reliable performance in critical testing scenarios.
- Wide Measurement Range: The B1512A accommodates a diverse range of measurement needs with a voltage range of up to 40 V, making it suitable for various device types.
- Data Logging and Analysis: Built-in data logging features enable users to capture and analyze measurement data easily, streamlining the testing process and aiding troubleshooting.
Specifications:
- Current Output: Up to 3 A
- Voltage Output: Up to 40 V
- Accuracy: Excellent measurement accuracy suitable for high-precision applications
- Dimension: Standard benchtop form factor
- Operating Environment: Designed for demanding lab conditions with rugged performance
Whether you are engaged in research or development, the Keysight B1512A High Current SourceMeter is the optimal choice for achieving accurate and reliable measurements. Unlock the potential of your semiconductor and electronic device testing with this state-of-the-art measurement tool.
