Keysight / Agilent B1530A Waveform Generator / Fast Measurement Unit Module
The Keysight B1530A Waveform Generator / Fast Measurement Unit Module (WGFMU) is engineered for ultra-fast current-voltage (IV), pulsed IV, and transient IV measurements, making it an essential tool for the R&D of next-generation semiconductors, devices, and materials. Designed to overcome the limitations of traditional measurement systems, the B1530A offers remarkable precision and speed for time-dependent measurements.
Key Features:
The Ultimate Solution for Accurate Measurements
- Integrated Arbitrary Waveform Generation: The B1530A combines arbitrary waveform generation with high-speed measurement capabilities, eliminating load line effects that can compromise measurement accuracy.
- Dynamic SMU Technology: Unique to Keysight, this technology enhances measurement sensitivity, making it ideal for the most demanding applications.
- Versatile Measurement Applications: Perfect for ultra-fast IV, pulsed IV, and transient IV measurements, including ultra-fast Negative Bias Temperature Instability (NBTI) and Random Telegraph Signal Noise (RTN) analyses.
Advanced Measurement Capabilities
- Precision Outputs: Offering a DC output along with arbitrary waveform generation that features a 10 ns programmable resolution (10V peak-to-peak output).
- Superior Measurement Speed: High-speed voltage and current measurements at a rate of 200 MSa/s with a 5ns sampling rate, ensuring rapid data acquisition.
- Dynamic Ranging: The B1530A automatically adjusts its measurement range fittingly for varying current levels, ensuring optimal range and resolution for every scenario.
- Dual Channel Output: Facilitates concurrent measurements, enhancing the efficiency and effectiveness of data collection.
The Keysight B1530A is a powerful instrument for researchers and engineers tackling the complexities of next-generation semiconductor reliability. With its state-of-the-art technology and user-friendly design, this module transforms the landscape of transient IV measurement and characterization.
