RENT KEYSIGHT E4991A (AGILENT)
The Keysight E4991A RF Impedance / Material Analyzer stands at the forefront of impedance measurement technology, designed specifically for innovative research and development in component and circuit design. With up to 3 GHz performance, it caters to advanced users who require high accuracy and comprehensive analysis capabilities.
Exceptional Measurement Precision
Employing an advanced RF-IV technique rather than conventional reflection measurement, the E4991A ensures superior accuracy across a wide range of impedances. Featuring a basic impedance accuracy of ±0.8%, it excels in the analysis of low-loss components, providing reliable data for critical applications.
Comprehensive Frequency Sweeping
The integrated synthesizer in the E4991A sweeps frequencies from 1 MHz to 3 GHz with a remarkable resolution of 1 mHz, making it versatile for various testing scenarios.
Material Evaluation Capabilities
Enhance your research with total dielectric and magnetic material measurement solutions available within a wide frequency range of 1 MHz to 1 GHz. The E4991A provides comprehensive insights essential for material characterization.
On-Wafer Measurement Solutions
The E4991A-010 Probe Station Connection Kit facilitates seamless integration with RF probe systems from Cascade Microtech, enabling precise on-wafer impedance measurements that are crucial in device fabrication and testing.
Advanced Temperature Characteristic Evaluation
Unlock the power of temperature analysis with the E4991A-007 temperature characteristic test kit. This solution allows for meticulous temperature characteristic measurements from -55°C to +150°C, complete with robust temperature drift compensation functions to enhance accuracy.
Key Specifications
- Basic Accuracy:
- Sweep Parameters:
- Frequency: 1 MHz to 3 GHz
- Oscillator level: Up to 1 dBm/0.5 Vrms/10 mArms
- DC bias level (Option E4991A-001): ± 40V or ± 50 mA
- Feature-Rich Interface:
- Windows-styled user interface
- Built-in VBA programming function
- Data transfer through LAN interface
- Versatile Measurement Options:
- Dielectric/magnetic material measurement (Option E4991A-002)
- Reliable on-wafer measurement (Option E4991A-010)
- Temperature characteristic measurement (Option E4991A-007)
