Microchip (Microsemi) 3120A
The Microsemi 3120A is a cutting-edge solution for precise phase-noise and Allan deviation measurements, capable of analyzing signals within the frequency range of 0.5 MHz to 30 MHz. This unit is essential for users needing to evaluate the full spectrum of commonly utilized frequency references, integrating seamlessly with an external reference and Windows-based computers.
Advanced Measurement Capabilities
Engineered with an all-digital architecture, the 3120A employs high-speed, low-noise analog-to-digital converters, eliminating the need for a phase-lock loop during measurements. The accompanying 3120A Phase Noise Test Software provides a user-friendly interface for conducting measurements efficiently, allowing users to characterize their frequency references in a cost-effective manner.
Optional Software Upgrades
AM Noise Measurement
This upgrade enables the 3120A to measure the AM noise spectrum of your input signal, displaying results in dBc/Hz across offsets ranging from 1 Hz to 100 kHz. Typically achieving instrument noise below -165 dBc/Hz at 10 kHz, this performance is critically important for in-depth analysis.
Signal Statistics – HDEV, TDEV, and MDEV Measurement
Enhance frequency stability monitoring with the Signal Statistics option, which delivers Modified Allan Deviation (MDEV), Hadamard Deviation (HDEV), Time Deviation (TDEV), jitter analysis, and residual FM metrics, alongside SSB carrier/noise levels for comprehensive insights into phase noise measurements.
Frequency Counter
With the Frequency Counter upgrade, obtain real-time charts of absolute frequency measurements, which are dynamically updated at averaging intervals from less than one second to over 1000 seconds, ensuring precise tracking of your signals.
Mask Test
The Mask Test option automates the evaluation of measurements against user-defined limit lines for phase noise, AM noise, Allan deviation, and other parameters, thereby streamlining production tests and optimizing performance.
Key Features
- Easy measurements with no pre-calibration or configuration required.
- Fast and accurate results presented within seconds of starting a measurement.
- Characterization of input carrier signals with unprecedented accuracy, achieving less than 100 fs at a 5 MHz carrier.
- Simultaneous measurement of Allan deviation and phase noise.
- Included easy-to-use 3120A Phase Noise Test Software compatible with Windows.
- Digital I/O expansion port and independent access to input ADCs included.
- Spurious-Free Dynamic Range (SFDR) specified at -100 dBc, with typical performance less than -130 dBc.
- Base model hardware kit supports both phase noise and Allan deviation measurements.
- Upgrade options available for:
- AM Noise License for Phase Noise Test Software
- Signal Statistics (MDEV, HDEV, TDEV, Jitter) License for Phase Noise Test Software
- Frequency Counter License for Phase Noise Test Software
- Mask Test License for Phase Noise Test Software
