Microsemi 53100A Phase Noise and Allan Deviation Tester
The Microsemi 53100A Phase Noise Analyzer is a powerful instrument designed for precise measurement of amplitude, phase, and frequency stability in high-performance RF sources. With an impressive frequency range of 1 MHz to 200 MHz, this advanced tester provides detailed insights into the stability characteristics of RF devices across multiple timescales—from femtoseconds to days. Its compact form factor and rapid measurement capabilities make it a versatile choice for both bench-top applications and integration into rack-mount ATE systems.
Building on the legacy of the 3120A and 51XXA series, the Microsemi 53100A excels in delivering fast and accurate single side band (SSB) phase noise and Allan deviation (ADEV) measurements, all while being cost-effective compared to alternative solutions. Utilizing cutting-edge host-based DSP techniques on a Windows® PC, it facilitates simultaneous measurement of various parameters, providing instantaneous results that can be saved, viewed, compared, or printed at your convenience. The instrument supports a range of export options, including compatibility with TSC 51XXA formats for seamless data management.
Accuracy and stability in the Microsemi 53100A are enhanced by a user-supplied external reference, allowing operation at any frequency within the specified range without the need for calibration. This systematic design improvement ensures reliable performance, making it a critical tool for professionals in the field.
Specifications for the Microsemi 53100A Phase Noise and Allan Deviation Tester:
| Frequency Range |
1 to 200 MHz |
| Offset Frequency Range |
0.001 Hz to 1 MHz |
| Allan Deviation |
|
| Input Signal Level |
–5 to +15 dBm |
See Datasheet for full specifications
