Stanford Research SR760 FFT Spectrum Analyzer, 100 kHz

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Manufactured by: Stanford Research

Category: Up to 3 GHz

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RENT STANFORD RESEARCH SYSTEMS SR760 FFT Spectrum Analyzer (call for availability)

The Stanford Research Systems SR760 FFT Spectrum Analyzer is the ultimate tool for professionals requiring a high-performance spectrum analysis solution. With its impressive single-channel design, this analyzer boasts a cutting-edge frequency range that stretches from DC to 100 kHz, making it a versatile instrument for a range of applications—from acoustics and vibration to noise measurement and general electronic use.

Key Features:

    • Bandwidth: DC to 100 kHz
    • Dynamic Range: 90 dB
    • Real-Time Bandwidth: 100 kHz
    • Analysis Modes: Harmonic, band, and sideband analysis
    • Hardcopy Output: Compatible with printers and plotters
    • Communication: Equipped with GPIB and RS-232 interfaces

Frequency Specifications:

    • Measurement Range: 476 µHz to 100 kHz
    • Frequency Spans: 191 mHz to 100 kHz (binary sequence)
    • Center Frequency: Anywhere from 0 to 100 kHz
    • Accuracy: 25 ppm (20 °C to 40 °C)
    • Resolution: Span/400
    • Window Functions: Blackman-Harris, Hanning, Flat-Top, and Uniform

Signal Input:

    • Channels: 1
    • Input Type: Single-ended or differential
    • Input Impedance: 1 MO, 15 pF
    • Coupling: AC or DC
    • CMRR (at 1 kHz): 90 dB (input range), 80 dB (input range), 50 dB (input range =14 dBV)
    • Noise Performance: Typ: 5 nVrms/vHz (-166 dBVrms/vHz), Max: 10 nVrms/vHz (-160 dBVrms/vHz)

Amplitude Characteristics:

    • Full-Scale Input Range: -60 dBV (1.0 mVp) to +34 dBV (50 Vp) in 2 dB steps
    • Dynamic Range: 90 dB (typ)
    • Harmonic Distortion: ≤ -80 dB from DC to 100 kHz (input range 0 dBV)
    • Spurious Responses: ≤ -85 dB below full scale (below 200 Hz), ≤ -90 dB below full scale (to 100 kHz, input range -50 dBV)
    • Input Sampling: 16-bit A/D at 256 kHz
    • Accuracy: ±0.3 dB ±0.02 % of full scale (excludes windowing effects)
    • Averaging Types: RMS, Vector, and Peak Hold, with linear and exponential averaging up to 64k scans

Trigger Input Features:

    • Trigger Modes: Continuous, internal, external, TTL
    • Internal Level: Adjustable to ±100% of input scale; supports positive or negative slope
    • External Trigger Levels: ±5 V in 40 mV steps, requires minimum trigger amplitude of 100 mV
    • Post-Trigger: Delays measurement record by 1 to 65,000 samples
    • Pre-Trigger: Starts measurement record up to 51.953 ms prior to the trigger
    • Phase Indeterminacy: < 2°

Display and Measurement Functions:

    • Display Options: Real, imaginary, magnitude, or phase
    • Measurements Available: Spectrum, power spectral density, time record, and 1/3 octave
    • Analysis Features: Band analysis, sideband analysis, total harmonic distortion, and trace math
    • Graphic Expand: Allows expansion up to ×50 about any point
    • Harmonic Marker: Displays up to 400 harmonics
    • Data Tables: Lists Y values for up to 200 points
    • Limit Tables: Detects data exceeding 100 user-defined upper/lower limit trace segments

General Specifications:

    • Monitor: Monochrome CRT, 640H by 480V resolution, with adjustable brightness and position
    • Interfaces: Standard IEEE-488.2 and RS-232; XT keyboard input for greater flexibility
    • Hardcopy Options: Supports screen dumps and data plots to compatible printers and plotters
    • Storage: 3.5" DOS compatible format, 1.44 Mbyte capacity
    • Power Requirements: 60 W, 100/120/220/240 VAC, 50/60 Hz

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