SyntheSys Research BERTSCOPE CR Clock Recovery Unit for BERTScope

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SyntheSys Research BERTSCOPE CR (CR12500A)

The BERTScope CR showcases cutting-edge technology designed for precision measurements, enabling engineers to achieve optimal performance in jitter testing and clock recovery. With an impressive PLL frequency response ranging from 100 kHz to 12 MHz, this instrument offers the highest loop bandwidth available on the market today.

Engineers can efficiently design and test various signals with unknown data rates, successfully recovering full-rate clocks, including those affected by spread spectrum techniques, for data rates ranging from 150 Mb/s to 12.5 Gb/s. The BERTScope CR delivers unparalleled control over critical parameters such as variable loop bandwidth, peaking/damping, and both first and second order rolloffs, ensuring accurate jitter tracking and improved signal integrity.

In compliance with numerous testing standards, the BERTScope CR employs a Golden PLL configuration. The variable loop bandwidth functionality allows users to expertly manage the amount of jitter transferred to the recovered clock. A narrower loop bandwidth setting effectively minimizes high-frequency jitter, resulting in a clock signal with reduced jitter—ideal for applications requiring the utmost signal clarity. Conversely, a wider loop bandwidth setting enables jitter transfer, mimicking the clock signals produced by the CDR of the receiver under test, making it adaptable to various standards and requirements.

As spread spectrum clocking (SSC) becomes essential in serial bus standards, the BERTScope CR stands out with its exceptional ability to track SSC signals with large frequency excursions of up to 5000 ppm. This feature positions the BERTScope CR as a pioneering clock recovery solution for technologies utilizing spread spectrum architecture, including Serial ATA, SAS, PCI Express, and FB DIMM applications.

Designed with engineers in mind, the BERTScope CR combines innovation with practicality, making it an invaluable tool for advanced testing needs in modern electronics.

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