TEKTRONIX BSA125C
The Tektronix BSA125C BERTScope™ Tester revolutionizes signal integrity measurements for serial data systems, enabling quick and precise bit error ratio (BER) detection. This advanced tool seamlessly combines eye diagram analysis with BER pattern generation, allowing users to pinpoint troublesome bit and pattern sequences effortlessly. With the BSA Series, you gain access to seven types of advanced error analysis that enhance statistical measurement depth like never before.
Key Features:
- High-speed BER Measurements up to 12.5 Gb/s
- Integrated and calibrated stress generation for Stressed Receiver Sensitivity and Clock Recovery Jitter Tolerance testing
- Supports a wide array of standards for comprehensive testing
- Sinusoidal jitter generation up to 100 MHz
- Random jitter capabilities
- Bounded and uncorrelated jitter functionality
- Sinusoidal interference generation
- Capabilities for spread spectrum clocking
Supported Standards:
The Tektronix BSA125C is designed for rigorous testing across various platforms:
Advanced Testing Capabilities:
- Jitter tolerance compliance testing with margin assessment
- Comprehensive physical layer test suite including mask testing, jitter peak measurement, BER contour, and Q-factor analysis
- Integrated eye diagram analysis correlated with BER
- Optional Jitter Map for comprehensive jitter decomposition, using long patterns like PRBS-31
- Patented Error Location Analysis™ for rapid identification of BER performance limitations, allowing detailed pattern-dependent error analysis
- PCIe 2.0 receiver testing capabilities
- F/2 jitter generation for 8xFC and 10GBASE-KR testing scenarios
