Tektronix PPG3204 Programmable Pattern Generator
Enhance your high-speed Datacom testing with the Tektronix PatternPro® PPG3204, a state-of-the-art programmable pattern generator that offers four channels of robust pattern generation, capable of handling data rates up to 32 Gb/s. Ideal for rigorous testing environments, this model is designed to support a range of applications, including 100 Gigabit Ethernet, 32G Fibre Channel, PAM4, and DP-QPSK testing.
Key Features and Specifications:
- Up to four independently configurable output channels operating at data rates of 16, 30, or 32 Gb/s.
- Low inherent jitter with typically 8 ps rise/fall times for PPG3200 fixed output models.
- Programmable output amplitude ranging from 300 mV to 1.0 V for the PPG3200 with Option ADJ, and 250 mV to 2.0 V for the PPG1600 and PPG3000 series.
- Advanced jitter insertion capabilities: low frequency & high amplitude jitter ranging from 10 Hz to 10 MHz at up to 5000 UI, with BUJ amplitudes of up to 50 psp-p at modulation rates up to 2.5 Gb/s when equipped with Option HFJIT.
- Programmable crossing point adjustable between 35% to 65% for enhanced signal integrity.
- Allows for complete end-to-end multi-channel BER testing when paired with thePED series error detector, providing a comprehensive testing solution.
- Supports jitter insertion options including BUJ, SJ, RJ, and PJ for versatile test configurations.
- Multi-channel units deliver aligned data outputs, facilitating crosstalk immunity tests and multi-channel functionality.
- Front panel touch screen GUI combined with USB computer control offers intuitive operation and easy setup.
- DC coupled differential data outputs ensure reliable signal transmission.
- Features built-in adjustable clock source for precise timing control during tests.
- Supports both PRBS and user-defined patterns for flexible testing options.
- Adjustable channel phase delay allows for meticulous synchronization and testing accuracy.
- Optimized for multi-channel 25 Gb/s testing in 100 G Ethernet applications, DQPSK, DP-QPSK, as well as semiconductor and component evaluations.
