The Tektronix TAP2500 single-ended Active FET Probe is engineered for precision in high-speed signal acquisition, making it an indispensable tool for advanced digital system designs. Specifically tailored for seamless integration with the TekVPI™ probe interface, this probe elevates your measurement capabilities with unparalleled efficiency and accuracy.
Features and Specifications of the Tektronix TAP2500 Active Probe:
- Features:
- High-speed signal acquisition with exemplary measurement fidelity:
- Minimizes device under test (DUT) loading effects with ≤1 pF input capacitance and 1 MΩ input resistance.
- Includes DUT attachment accessories for versatile connection to small SMDs.
- Maintains instrument bandwidth at the probe tip for oscilloscopes with ≤1 GHz bandwidth.
- Directly connects to oscilloscope using the TekVPI™ probe interface.
- Enables automatic units scaling and readout on the oscilloscope display for streamlined operation.
- Offers easy access to the oscilloscope probe menu for:
- Probe status and diagnostic information.
- Controlling probe DC offset.
- Facilitates remote GPIB/USB probe control through the oscilloscope for convenient operation.
- Applications include:
- Verification, debugging, and characterization of high-speed designs.
- Signal integrity, jitter, and timing analysis.
- Manufacturing engineering and testing environments.
- Educational research needs.
- Supports signals with voltage swings up to 8 Vpk-pk.
- Specifications:
- High Probe Bandwidth: ≥2.5 GHz
- Fast Probe Rise Time: Unmatched responsiveness
- Input Capacitance: ≤0.8 pF
- Input Dynamic Range: –4 V to +4 V
- Input Offset Range: –10 V to +10 V
- Maximum Input Voltage (nondestructive): ±30 V (DC + peak AC)
- Propagation Delay: 5.3 ns
