Tektronix TDP3500 Differential Probe, 3.5 GHz

The Tektronix TDP3500 Probe is a standout Differential-ended Active probe designed for precision and accuracy in high-frequency measurements. With its capability to provide true signal reproduction and fidelity, it meets the demands of today’s advanced digital system designs. The TDP3500 is specifically engineered for seamless connectivity with Tektronix oscilloscopes featuring the TekVPI™ probe interface, ensuring optimal performance.

Key Features of the TDP3500 Differential Probe

• Outstanding electrical performance:
  • High bandwidth for accurate measurements in serial and digital applications.
  • Excellent common mode rejection to minimize measurement errors in noisy environments.
  • Low capacitive and resistive loading:
    • Maintains signal fidelity.
    • Reduces DC biasing interactions.
• Versatile mechanical performance:
  • Compact probe head allows probing of small geometric circuit elements.
  • Includes DUT attachment accessories for connecting to fine-spaced SMDs.
  • Robust design enhances reliability in various applications.
• Direct connection to oscilloscopes via the TekVPI™ probe interface.
• Automatic units scaling and readout displayed on the oscilloscope.
• Integration of probe characteristics within the oscilloscope enhances usability.
• Probe control through easy access to menu displays for:
  • Probe status.
  • Setup control.
  • Diagnostic information.

Integrated Scope/Probe System

• Directly connects to and is powered from TekVPI™ Oscilloscope Interface, eliminating the need for an external power supply.
• Single-button access to oscilloscope probe menu for streamlined operation.
• Setup and control from both comp box and oscilloscope user interfaces.
• AutoZero function for zeroing output offset.
• Remote GPIB/USB probe control via the oscilloscope.

Applications

• Ideal for design, validation, debugging, and characterization of high-speed serial bus designs including:
  • I²C
  • CAN/LIN
  • SPI
  • Serial ATA
  • Ethernet (GbE)
  • USB 2.0
  • Firewire (1394b)
• Signal integrity, jitter, and timing analysis.
• Manufacturing, engineering, and testing applications.

Specifications

• Probe Bandwidth: ≥3.5 GHz warranted
• Probe Attenuation: 5x
• Probe Rise Time: ≤110 ps typical
• Differential Input Capacitance: ≤0.3 pF
• Differential Input Resistance: 100 kΩ
• Differential Input Dynamic Range: ±2 V
• CMRR (Common Mode Rejection Ratio):
  • >60 dB at 1 MHz
  • >25 dB at 1 GHz
• Input Offset Range: ±1 V displayed
• Common Mode Input Voltage Range: +5 V to -4 V
• Noise: approximately 35 nV/root Hz
• Max Input Voltage (Non-destructive): ±15 V (DC + peak AC)
• Propagation Delay: 5.4 ns typical