Keithley 4210-CVU
Capacitance Voltage Unit (CVU)
The Keithley 4210-CVU is a state-of-the-art Capacitance Voltage Unit (CVU) designed for precision testing in both research and industrial applications. Seamlessly integrating low frequency and high frequency capacitance-voltage measurements, this versatile instrument plays a vital role in the characterization of semiconductor materials and devices.
Equipped with a range spanning from 1 kHz to 10 MHz, the Keithley 4210-CVU delivers exceptional performance for C-V measurements. Through its specialized VLF C-V technique, users can execute low frequency C-V measurements with ease, while the high frequency capabilities ensure that accurate data is obtained across various testing conditions. The device further includes a built-in I-V test function, making it suitable for initial screening of leakage currents in devices with unknown characteristics.
This advanced capacitance-voltage card allows for a comprehensive understanding of device behavior, supporting capacitance measurements from femtofarads (fF) to microfarads (µF). The Keithley 4210-CVU provides diagnostic tools that validate your C-V test results, ensuring reliable and repeatable outcomes.
With the option to configure linear or custom C-V, C-f, and C-t sweeps, users can analyze up to 4096 data points to suit specific experimental needs. The system's open environment allows for extensive customization, enabling researchers and engineers to modify existing tests to explore new frontiers in semiconductor technology.
Optimize your testing process and elevate your laboratory capabilities with the Keithley 4210-CVU—the ultimate solution for precise and efficient C-V measurements.
