Keysight / Agilent N1021B Differential TDR Probe Kit, 18 GHz

Keysight N1021B (Agilent) - Advanced Handheld Probe

The Keysight N1021B is an expertly engineered handheld probe specifically designed to interface with Time Domain Reflectometry (TDR) and Time Domain Transmission (TDT) modules, such as the 54754A. This innovative tool allows for seamless connectivity to printed circuit boards (PCBs) and components that do not utilize standard coaxial high-frequency connectors.

Featuring an intuitive built-in wheel, the N1021B allows users to effortlessly adjust the pitch between its differential tips. This enabling feature makes it simple to achieve optimal contact between the probe and various pad or access point configurations, whether they are closely spaced or aligned with typical integrated circuit (IC) pin layouts (2.54 mm).

Engineers focusing on high-speed differential electrical channels can utilize the N1021B to effectively analyze and pinpoint the causes of reflections that negatively impact signal integrity (SI) in their designs. For PCB manufacturers, this tool plays a vital role in maintaining consistency across production batches, as well as identifying specific locations for shorts, opens, or other defects.

Key Features and Specifications

• Bandwidth: 18 GHz
• Standard Differential Impedance: 100 Ohm
• Variable Tip Spacing: Adjustable from 0.0 mm to 2.54 mm
• Spring-Loaded Probe Tips: Independent Z-axis movement for enhanced versatility

The Keysight N1021B is designed to be compatible with the industry-standard 86100C Infiniium DCA-J Wideband Oscilloscope Mainframe, the 86100C-202 Enhanced Impedance and S-Parameter Software, and the 54754A Differential & Single-ended TDR-TDT Module. By launching small electrical steps into the Device Under Test (DUT) and collecting the resultant responses, this probe enables precise processing and visualization both in the time domain and as S-parameters (SDD11, SDD22, SDD21, or SDD22). Time-domain measurements effectively capture reflected voltages or impedance readings over time or distance, while S-parameter measurements provide insights into magnitude, phase, and group delay.