RENT SOLAR 2854-2 Spike Generator (Call for Availability)
The Solar Model 2854-2 Spike Generator is an essential tool for conducting transient susceptibility tests in controlled environments, tailored to meet the rigorous standards outlined in MIL-STD-461F, Test Method CS106.
Product Overview
This advanced spike generator delivers a precise 5 µS ±22% pulse with an impressive rise time of 1.5 µS ±0.5 µS across a 5.0 Ω non-inductive resistor. It features adjustable voltage levels surpassing 400 V, ensuring it meets diverse testing requirements. The undershoot is meticulously controlled, limited to less than 120 V peak (maximum) and under 20 µS, providing reliable performance during critical testing scenarios.
Key Specifications
- Output Levels: Adjustable from 10 V to over 400 V into 5 Ω
- Pulse Features: Variable repetition rate from 0.8 pulses per second to 10 pulses per second, allowing for flexible testing conditions.
- Front Panel Control: Single transients can be easily initiated with a convenient pushbutton, ensuring controlled isolation of transient effects.
- Injection Options: Two sets of output terminals facilitate both parallel and series injection into the power line. Note: Series injection is applicable for both DC and AC lines; parallel injection is exclusively for DC lines.
- Power Handling: The output winding for series injection supports a power current capacity of 25 A, enhancing its versatility.
- Isolation Features: Output terminals are isolated from the chassis and power cord, ensuring safe operation.
Construction and Dimensions
The Solar 2854-2 encompasses a standard rack panel design with dimensions of 19" wide x 7" high x 12.75" deep (48.26 cm x 17.78 cm x 32.38 cm), making it suitable for integration into various setups.
Advanced Features
- Allows adjustable pulse positioning on AC lines, effectively relating transient susceptibility to real-time aspects of digital systems.
- Robust construction ensures reliability during extensive testing procedures.
With the Solar Model 2854-2 Spike Generator, users can confidently conduct transient susceptibility tests, enhancing the understanding and resilience of electronic systems under various electrical conditions.