Introducing the Tektronix TAP3500, the single-ended Active FET Probe meticulously crafted for high-speed digital system designs. With its robust performance, this probe ensures precise electrical and mechanical measurements tailored for advanced technology applications.
Features and Specifications of the Tektronix TAP3500 Active Probe include:
- Features:
- Unparalleled signal fidelity and acquisition speed:
- Minimized DUT loading effects with input capacitance of ≤1 pF and input resistance of 1 MΩ
- Flexible DUT connectivity via specialized attachment accessories suitable for small SMDs
- Maintains instrument bandwidth at the probe tip, optimized for use with ≤1 GHz oscilloscopes
- Seamless connection to oscilloscopes using the TekVPI™ probe interface
- Automatic unit scaling and readouts displayed on the oscilloscope
- User-friendly access to oscilloscope probe menu:
- Monitor probe status and diagnostics effortlessly
- Control probe DC offset with ease
- Remote GPIB/USB probe control available through the oscilloscope
- Applications:
- Verification, debugging, and characterization of high-speed designs
- Signal integrity analysis, jitter assessment, and timing analysis
- Manufacturing engineering and testing processes
- Ideal for educational research
- Compatible with signals featuring voltage swings of up to 8 Vpk-p
- Specifications:
- High Probe Bandwidth: ≥3.5 GHz
- Fast Probe Rise Time: Achieves rapid response times
- Input Capacitance: ≤0.8 pF
- Input Dynamic Range: –4 V to +4 V
- Input Offset Range: –10 V to +10 V
- Maximum Input Voltage (nondestructive): ±30 V (DC + peak AC)
- Propagation Delay: 5.3 ns
