Keithley 7072 Semiconductor Matrix Card
The Keithley 7072 Semiconductor Matrix Card is a sophisticated solution tailored for low-level and high-impedance measurements, making it an essential tool for semiconductor parametric testing on wafers and various devices. Engineered to excel in sensitive environments, this matrix card features a unique design that ensures precision and reliability in your testing processes.
Key Features
- Two Low-Current Circuits: Equipped with a specified maximum offset current of just 1pA, the Keithley 7072 supports sub-picoamp measurement resolution, allowing for accurate evaluations of low-level signals.
- C-V Measurement Capability: Includes two dedicated Capacitance-Voltage paths for measuring characteristics from DC up to 1MHz, giving you versatility in your testing applications.
- High-Quality Signal Paths: Four additional signal paths enhance the card's capability, ensuring excellent signal integrity during various measurement scenarios.
Specifications
- Matrix Configuration: 8 rows by 12 columns, providing an organized structure for complex testing protocols.
- Triaxial Connection: Features a 3-lug triaxial design (Signal, Guard, Chassis) to minimize noise interference and ensure accurate readings.
- Voltage and Current Ratings: Capable of handling 200V and 1A carry (0.5A switched), with a peak power rating of 10VA for resistive loads, ensuring durability under varying operational conditions.
- Voltage Isolation: Maximum 200V between any two pins or chassis, providing a safe and robust measurement environment.
The Keithley 7072 is the ideal matrix card for professionals seeking high precision and reliability in semiconductor testing. Elevate your measurement capabilities with this exceptional tool, designed to meet the rigorous demands of modern electronics research and development.
