Tektronix TDP1500 Differential Probe, 1.5 GHz

Tektronix TDP1500 Differential Probe, 1.5 GHz

The Tektronix TDP1500 Probe is a high-performance Differential-ended Active probe designed for precise and accurate high-frequency measurements. With its exceptional speed and reliability, this probe is specifically engineered for seamless integration with Tektronix oscilloscopes utilizing the TekVPI™ probe interface, ensuring optimal performance and signal fidelity.

Features & Specifications

• Outstanding Electrical Performance:
  • Bandwidth guaranteeing accurate measurements for digital and serial applications.
  • Superior common mode rejection minimizes measurement errors in noisy environments.
  • Low Capacitive and Resistive Loading:
    • Maintains signal integrity.
    • Reduces DC biasing interactions for better results.
• Versatile Mechanical Performance:
  • Compact probe head for accessibility to small geometry circuit components.
  • DUT attachment accessories facilitate connections to densely packed SMDs.
  • Designed for robustness, ensuring long-lasting reliability.
• Direct connectivity to oscilloscopes via the TekVPI™ probe interface.
• Automatic unit scaling and real-time readout on the oscilloscope display.
• Embedded probe characteristics offer enhanced usability within the oscilloscope.
• Accessible probe control and diagnostic information through oscilloscope menus.
• Integrated Scope/Probe System:
  • Powered directly from the TekVPI™ Oscilloscope Interface without the need for external power supplies.
  • Single-button access to oscilloscope probe menu settings.
  • Setup and control available via the control box or oscilloscope interface.
  • AutoZero functionality to eliminate output offset.
  • Remote control capabilities via GPIB/USB through the oscilloscope.
• Applications:
  • Design, validation, debugging, and characterization of high-speed serial bus designs including:
    • I²C, CAN/LIN, SPI, Serial ATA, Ethernet (GbE), USB 2.0, Firewire (1394b).
  • Signal integrity assessments, jitter, and timing analysis.
  • Support for manufacturing, engineering, and testing processes.

Specifications

• Probe Bandwidth: ≥1.5 GHz warranted
• Probe Attenuation: 1x, 10x
• Probe Rise Time: ≤265 ps typical
• Differential Input Capacitance: ≤1 pF
• Differential Input Resistance: 200 kΩ
• Differential Input Dynamic Range:
  • ±8.5 V (10x)
  • ±850 mV (1x)
• CMRR:
  • ＞60 dB at 1 MHz
  • ＞25 dB at 1 GHz
• Input Offset Range: ±7 V (10x or 1x)
• Operation Voltage Input Range:
  • ±7 V (1x)
  • ±7 V (10x)
• Max Input Voltage (Nondestructive): ±25 V (DC + pk AC)
• Propagation Delay: 5.4 ns typical